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authorSeung-Woo Kim <sw0312.kim@samsung.com>2017-03-27 12:50:37 +0900
committerSeung-Woo Kim <sw0312.kim@samsung.com>2017-03-31 12:47:55 +0900
commit10d7e26adebdea07abed036ffbe0dd2add97c035 (patch)
tree0c4a2307f92e848f422e1f7fced171b086b0d818
parent1b335512700fdb18625ba82b7f6f4d0362260b53 (diff)
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ipptest: fix memory leak issues during dumping connector
In rotator test of ipptest, allocated connector is not freed in dump_connectors, so it should be freed to remove memory leak. Change-Id: I8ee32e85238901bcc516c855be07bb2cfb5e1d9c Signed-off-by: Seung-Woo Kim <sw0312.kim@samsung.com>
-rw-r--r--tests/rottest/rottest.c4
1 files changed, 3 insertions, 1 deletions
diff --git a/tests/rottest/rottest.c b/tests/rottest/rottest.c
index ef0b69e9..9a7b063d 100644
--- a/tests/rottest/rottest.c
+++ b/tests/rottest/rottest.c
@@ -197,8 +197,10 @@ static void dump_connectors(void)
connector->encoders[j]);
printf("\n");
- if (!connector->count_modes)
+ if (!connector->count_modes) {
+ drmModeFreeConnector(connector);
continue;
+ }
printf(" modes:\n");
printf(" name refresh (Hz) hdisp hss hse htot vdisp "