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| author | Simon Glass <sjg@chromium.org> | 2020-07-28 19:41:12 -0600 |
|---|---|---|
| committer | Tom Rini <trini@konsulko.com> | 2020-08-07 22:31:32 -0400 |
| commit | e180c2b129016baf21086eca73767844e7eff185 (patch) | |
| tree | 9024230dcb1a4f3480cc18a4bed4e965ff406d51 /test/dm/acpigen.c | |
| parent | bd34715599c17e0d3f09af1cdfba8af120bc8602 (diff) | |
| download | u-boot-e180c2b129016baf21086eca73767844e7eff185.tar.gz u-boot-e180c2b129016baf21086eca73767844e7eff185.tar.bz2 u-boot-e180c2b129016baf21086eca73767844e7eff185.zip | |
dm: Rename DM test flags to make them more generic
The test flags used by driver model are currently not available to other
tests. Rather than creating two sets of flags, make these flags generic
by changing the DM_ prefix to UT_ and moving them to the test.h header.
This will allow adding other test flags without confusion.
Signed-off-by: Simon Glass <sjg@chromium.org>
Diffstat (limited to 'test/dm/acpigen.c')
| -rw-r--r-- | test/dm/acpigen.c | 18 |
1 files changed, 9 insertions, 9 deletions
diff --git a/test/dm/acpigen.c b/test/dm/acpigen.c index 14a758d08a..1b2767e732 100644 --- a/test/dm/acpigen.c +++ b/test/dm/acpigen.c @@ -167,7 +167,7 @@ static int dm_test_acpi_interrupt(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_acpi_interrupt, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_acpi_interrupt, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); /* Test emitting a GPIO descriptor */ static int dm_test_acpi_gpio(struct unit_test_state *uts) @@ -212,7 +212,7 @@ static int dm_test_acpi_gpio(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_acpi_gpio, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_acpi_gpio, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); /* Test emitting a GPIO descriptor with an interrupt */ static int dm_test_acpi_gpio_irq(struct unit_test_state *uts) @@ -257,7 +257,7 @@ static int dm_test_acpi_gpio_irq(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_acpi_gpio_irq, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_acpi_gpio_irq, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); /* Test emitting either a GPIO or interrupt descriptor */ static int dm_test_acpi_interrupt_or_gpio(struct unit_test_state *uts) @@ -297,7 +297,7 @@ static int dm_test_acpi_interrupt_or_gpio(struct unit_test_state *uts) return 0; } DM_TEST(dm_test_acpi_interrupt_or_gpio, - DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); + UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); /* Test emitting an I2C descriptor */ static int dm_test_acpi_i2c(struct unit_test_state *uts) @@ -329,7 +329,7 @@ static int dm_test_acpi_i2c(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_acpi_i2c, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_acpi_i2c, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); /* Test emitting a SPI descriptor */ static int dm_test_acpi_spi(struct unit_test_state *uts) @@ -365,7 +365,7 @@ static int dm_test_acpi_spi(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_acpi_spi, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_acpi_spi, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); /* Test emitting a length */ static int dm_test_acpi_len(struct unit_test_state *uts) @@ -806,7 +806,7 @@ static int dm_test_acpi_gpio_toggle(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_acpi_gpio_toggle, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_acpi_gpio_toggle, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); /* Test writing ACPI code to output power-sequence info */ static int dm_test_acpi_power_seq(struct unit_test_state *uts) @@ -873,7 +873,7 @@ static int dm_test_acpi_power_seq(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_acpi_power_seq, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_acpi_power_seq, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); /* Test writing values */ static int dm_test_acpi_write_values(struct unit_test_state *uts) @@ -947,7 +947,7 @@ static int dm_test_acpi_scope(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_acpi_scope, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_acpi_scope, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); /* Test writing a resource template */ static int dm_test_acpi_resource_template(struct unit_test_state *uts) |