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| author | Mauro Carvalho Chehab <mchehab+huawei@kernel.org> | 2020-10-30 08:40:50 +0100 |
|---|---|---|
| committer | Greg Kroah-Hartman <gregkh@linuxfoundation.org> | 2020-10-30 13:14:29 +0100 |
| commit | 54a19b4d3fe0fa0a31b46cd60951e8177cac25fa (patch) | |
| tree | b84ba6fc592daf836a6f42c6a1ba5eda91d73c73 /Documentation/ABI/testing/sysfs-class-led-flash | |
| parent | ed8c39d43983d19f181ff47af0374c4e252f84bd (diff) | |
| download | linux-riscv-54a19b4d3fe0fa0a31b46cd60951e8177cac25fa.tar.gz linux-riscv-54a19b4d3fe0fa0a31b46cd60951e8177cac25fa.tar.bz2 linux-riscv-54a19b4d3fe0fa0a31b46cd60951e8177cac25fa.zip | |
docs: ABI: cleanup several ABI documents
There are some ABI documents that, while they don't generate
any warnings, they have issues when parsed by get_abi.pl script
on its output result.
Address them, in order to provide a clean output.
Reviewed-by: Tom Rix <trix@redhat.com> # for fpga-manager
Reviewed-By: Kajol Jain<kjain@linux.ibm.com> # for sysfs-bus-event_source-devices-hv_gpci and sysfs-bus-event_source-devices-hv_24x7
Acked-by: Jonathan Cameron <Jonathan.Cameron@huawei.com> #for IIO
Acked-by: Oded Gabbay <oded.gabbay@gmail.com> # for Habanalabs
Acked-by: Vaibhav Jain <vaibhav@linux.ibm.com> # for sysfs-bus-papr-pmem
Acked-by: Cezary Rojewski <cezary.rojewski@intel.com> # for catpt
Acked-by: Suzuki K Poulose <suzuki.poulose@arm.com>
Acked-by: Ilya Dryomov <idryomov@gmail.com> # for rbd
Acked-by: Jonathan Corbet <corbet@lwn.net>
Signed-off-by: Mauro Carvalho Chehab <mchehab+huawei@kernel.org>
Link: https://lore.kernel.org/r/5bc78e5b68ed1e9e39135173857cb2e753be868f.1604042072.git.mchehab+huawei@kernel.org
Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
Diffstat (limited to 'Documentation/ABI/testing/sysfs-class-led-flash')
| -rw-r--r-- | Documentation/ABI/testing/sysfs-class-led-flash | 27 |
1 files changed, 18 insertions, 9 deletions
diff --git a/Documentation/ABI/testing/sysfs-class-led-flash b/Documentation/ABI/testing/sysfs-class-led-flash index 220a0270b47b..11e5677c3672 100644 --- a/Documentation/ABI/testing/sysfs-class-led-flash +++ b/Documentation/ABI/testing/sysfs-class-led-flash @@ -55,26 +55,35 @@ Description: read only Flash faults are re-read after strobing the flash. Possible flash faults: - * led-over-voltage - flash controller voltage to the flash LED + * led-over-voltage + flash controller voltage to the flash LED has exceeded the limit specific to the flash controller - * flash-timeout-exceeded - the flash strobe was still on when + * flash-timeout-exceeded + the flash strobe was still on when the timeout set by the user has expired; not all flash controllers may set this in all such conditions - * controller-over-temperature - the flash controller has + * controller-over-temperature + the flash controller has overheated - * controller-short-circuit - the short circuit protection + * controller-short-circuit + the short circuit protection of the flash controller has been triggered - * led-power-supply-over-current - current in the LED power + * led-power-supply-over-current + current in the LED power supply has exceeded the limit specific to the flash controller - * indicator-led-fault - the flash controller has detected + * indicator-led-fault + the flash controller has detected a short or open circuit condition on the indicator LED - * led-under-voltage - flash controller voltage to the flash + * led-under-voltage + flash controller voltage to the flash LED has been below the minimum limit specific to the flash - * controller-under-voltage - the input voltage of the flash + * controller-under-voltage + the input voltage of the flash controller is below the limit under which strobing the flash at full current will not be possible; the condition persists until this flag is no longer set - * led-over-temperature - the temperature of the LED has exceeded + * led-over-temperature + the temperature of the LED has exceeded its allowed upper limit |